电子与封装2024，Vol.24Issue(8)：21-24,4.DOI:10.16257/j.cnki.1681-1070.2024.0086
基于STM32H7的ADC静态参数测量系统设计
STM32H7-Based ADC Static Parameter Measurement System Design
丁光洲 1高宁 1徐晴昊 1徐忆 1李辉1
作者信息
- 1. 中国电子科技集团公司第五十八研究所,江苏无锡 214035
- 折叠
摘要
Abstract
Domestic digital power supply has become an indispensable product in power supply chips,and the accuracy of the analog-to-digital converter(ADC)chip inside its internal feedback control loop directly affects the accuracy and stability of the output of the whole power supply.The static parameters of the ADC,namely integral nonlinearity(INL)and differential nonlinearity(DNL),are the important indexes for evaluating the accuracy of the ADC.At present,the domestic equipment for testing the static parameters of ADC in digital power supply is complicated and costly,and is not independently controllable.Therefore,it is especially important to design a low-cost and easy-to-operate static parameter test system.An ADC static parameter test system based on STM32H7 is designed,and the accuracy and feasibility of the system are verified by experiments.关键词
ADC/测试系统/数字电源/静态参数Key words
ADC/test system/digital power supply/static parameter分类
信息技术与安全科学引用本文复制引用
丁光洲,高宁,徐晴昊,徐忆,李辉..基于STM32H7的ADC静态参数测量系统设计[J].电子与封装,2024,24(8):21-24,4.
