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GaN芯片封装技术研究进展与趋势

宋海涛 敖金平 王霄 龚平 朱霞 李杨 刘璋成 闫大为 陈治伟 尤杰

电子与封装2025,Vol.25Issue(3):123-133,11.
电子与封装2025,Vol.25Issue(3):123-133,11.DOI:10.16257/j.cnki.1681-1070.2025.0104

GaN芯片封装技术研究进展与趋势

Research Progress and Trend of GaN Chip Packaging Technology

宋海涛 1敖金平 1王霄 1龚平 2朱霞 1李杨 1刘璋成 1闫大为 1陈治伟 1尤杰1

作者信息

  • 1. 江南大学集成电路学院江苏省智能传感器与专用集成电路工程研究中心,江苏无锡 214122||江南大学集成电路学院物联网技术应用教育部工程研究中心,江苏无锡 214122
  • 2. 无锡华润安盛科技有限公司,江苏无锡 214111
  • 折叠

摘要

Abstract

As a third-generation semiconductor material,GaN is widely used in high-frequency and high-power electronic devices because of its excellent characteristics such as high electron mobility and high breakdown field strength.However,its packaging technology faces challenges such as thermal management,electrical performance optimization,and packaging reliability,as well as the need to be more compact and integrated.Various solutions for GaN chip packaging are discussed,including discrete device packaging structures of transistor outline(TO)packaging and quad-flat no-lead(QFN)packaging,closed device packaging structures of wafer-level packaging(WLP)and multi-chip module(MCM),and many advanced packaging technologies.The development trend of packaging technology is analyzed,such as integration,modular packaging,and optimization methods for high-frequency and high-power applications.With the continuous breakthrough of technology,GaN packaging is expected to make further progress in the direction of more efficient and more reliable to meet the growing market demand.

关键词

GaN/芯片封装/先进封装/散热/寄生电感/3D集成

Key words

GaN/chip packaging/advanced packaging/heat dissipation/parasitic inductance/3D integration

分类

信息技术与安全科学

引用本文复制引用

宋海涛,敖金平,王霄,龚平,朱霞,李杨,刘璋成,闫大为,陈治伟,尤杰..GaN芯片封装技术研究进展与趋势[J].电子与封装,2025,25(3):123-133,11.

基金项目

国家自然科学基金(62104183,61991442) (62104183,61991442)

江苏省重点研发计划产业前瞻与关键核心技术(BE2023007-1) (BE2023007-1)

中央高校基本科研业务费(JUSRP123057,JUSRP123058,JUSRP123059) (JUSRP123057,JUSRP123058,JUSRP123059)

电子与封装

1681-1070

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