电子与封装2025，Vol.25Issue(4)：39-47,9.DOI:10.16257/j.cnki.1681-1070.2025.0043
模拟开关通用测试系统研究
Research of the Generalized Testing System for Analog Switch
钟昂 1戴畅1
作者信息
- 1. 中国电子科技集团公司第二十四研究所,重庆 400060
- 折叠
摘要
Abstract
The traditional analog switch testing system has common issues such as long development cycles and insufficient testing precision of some parameters,which gradually fails to meet the current requirements of mass production testing for high-performance devices.Using the compatibility of the common motherboard and the accuracy and stability of the large-scale test equipment,a general testing system for analog switch based on V93000 automatic test equipment is designed.The system has strong adjustability,wide compatibility,high accuracy,and is easy to operate.When testing and developing new products,only simple hardware design and visual window software debugging are needed,which can greatly shorten the development cycle of the analog switch device testing system,improve efficiency,reduce costs,and ensure the accuracy and stability of testing parameters.关键词
测试系统/模拟开关/自动测试设备/硬件设计Key words
testing system/analog switch/automatic test equipment/hardware design分类
信息技术与安全科学引用本文复制引用
钟昂,戴畅..模拟开关通用测试系统研究[J].电子与封装,2025,25(4):39-47,9.
