电子与封装2025，Vol.25Issue(6)：49-53,5.DOI:10.16257/j.cnki.1681-1070.2025.0073
VCD和WGL文件转换为ATE测试向量的方法
Method for Converting VCD and WGL Files into ATE Test Vectors
欧阳涛 1谭勋琼 1李振涛2
作者信息
- 1. 长沙理工大学物理与电子科学学院,长沙 410114
- 2. 长沙理工大学物理与电子科学学院,长沙 410114||湖南毂梁微电子有限公司,长沙 410000
- 折叠
摘要
Abstract
The important applications of VCD(value change dump)and WGL(waveform generation language)waveform description files in the field of integrated circuits are introduced,and a comprehensive analysis of the elements in VCD and WGL files is conducted.Based on the characteristics of waveform files,a strategy of parsing files line by line and matching keywords is adopted.A configuration file is introduced to control the data processing process,converting waveform files into the test vectors required by automatic test equipment(ATE).The implementation is achieved in a Linux environment using C/C++languages.Practical applications show that this method is simple and efficient,the conversion time of VCD and WGL files is significantly reduced respectively while ensuring the normal functioning of the test vectors,achieving the goal of improving conversion efficiency.关键词
仿真波形文件/自动测试机台/测试向量/集成电路测试Key words
simulation waveform file/automatic test equipment/test vector/integrated circuit testing分类
电子信息工程引用本文复制引用
欧阳涛,谭勋琼,李振涛..VCD和WGL文件转换为ATE测试向量的方法[J].电子与封装,2025,25(6):49-53,5.
