电子与封装2025，Vol.25Issue(12)：40-46,7.DOI:10.16257/j.cnki.1681-1070.2025.0168
某型探测器随机振动失效与可靠性分析
Random Vibration Failure and Reliability Analysis of a Detector
摘要
Abstract
A microstructural analysis is conducted on pin breakage observed in a specific detector during random vibration testing.Finite element simulations and optimized results analysis are performed using ANSYS Workbench.Metallographic and scanning electron microscopy(SEM)analysis results indicate that the fracture mechanism of the pins is fatigue fracture.Using the finite element software ANSYS Workbench,modal analysis and sweep frequency analysis are performed on the detector to obtain the structural natural frequency response characteristics.The maximum 3σ stress at the pin and its root stress response power spectral density are obtained through random vibration analysis.The vibration fatigue life of the pin is calculated based on the Steinberg three-interval method.Compared with experimental results,the relative error is about 29.5％,demonstrating good consistency between the two methods.Further exploration of the influence of different pin mounting heights on its vibration fatigue performance shows that reducing the pin mounting height can improve its natural frequency and fatigue life.关键词
随机振动/疲劳断裂/疲劳寿命/模态分析/引脚Key words
random vibration/fatigue fracture/fatigue life/modal analysis/pin分类
信息技术与安全科学引用本文复制引用
袁中朝,许亚能,吴虹屿,陈彤,胡鑫..某型探测器随机振动失效与可靠性分析[J].电子与封装,2025,25(12):40-46,7.基金项目
电科芯片发展资金项目(K4402ZZ2023022) （K4402ZZ2023022）
