电子与封装2026，Vol.26Issue(1)：48-56,9.DOI:10.16257/j.cnki.1681-1070.2026.0016
多数据传输速率SerDes的测试方法研究
Research on Test Methods for Multi-Data-Rate SerDes
摘要
Abstract
Serializer/deserializer(SerDes)parameter test is an indispensable part of chip test.However,testing the transmitter and receiver of a multi-data-rate SerDes generally needs to be carried out separately,and the test environment is relatively complex.Continuously changing the test environment leads to a lengthy test process and reliability reduction.Based on the test requirements of a multi-data-rate switching chip,a test setup is developed that enables simultaneous testing of the SerDes transmitter and receiver across multiple data rates.Furthermore,high-and low-temperature testing can be performed using the same setup without any modifications throughout the entire test process.Test results demonstrate that this test system can perform triple-temperature testing on the transmitter and receiver ends of SerDes chips with transmission rates ranging from 4.250-53.125 Gbit/s.The test method is convenient,and the test data is authentic and reliable.关键词
SerDes测试/多数据传输速率测试/高低温测试/误码率/眼图Key words
SerDes testing/multi-data-rate testing/high-and low-temperature testing/bit error rate/eye diagram分类
信息技术与安全科学引用本文复制引用
曹睿,张霞,李智超,王兆辉,侯帅康..多数据传输速率SerDes的测试方法研究[J].电子与封装,2026,26(1):48-56,9.基金项目
国家重点研发计划(2022YFB2901000) （2022YFB2901000）
