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微控制器板卡量产阶段失效分析与整改

曾鹏 李金利

电子与封装2026,Vol.26Issue(4):44-48,5.
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电子与封装2026,Vol.26Issue(4):44-48,5.DOI:10.16257/j.cnki.1681-1070.2026.0044

微控制器板卡量产阶段失效分析与整改

Failure Analysis and Remediation for Microcontroller Unit Boards During Mass Production

曾鹏 1李金利1

作者信息

  • 1. 中科芯集成电路有限公司,江苏无锡 214072
  • 折叠

摘要

Abstract

To address the high failure rate of a microcontroller unit board during mass production,a systematic failure analysis and engineering remediation study was conducted.Through electrical characteristic testing,post-decapsulation microscopic inspection,and production environment monitoring,the root causes were identified as production line grounding hazards,non-standardized operations,and inadequate hardware circuit protection.Comprehensive corrective actions were implemented,including grounding system upgrades,standardized operating procedures,and enhanced circuit protection.After batch validation of 2 500 units,all passed testing with the failure rate reduced to zero.Results demonstrate that integrated improvements in electrical safety,standardized operational management,and refined hardware circuit design effectively eliminate electrostatic discharge(ESD)and electrical overstress(EOS)risks,significantly boosting production yield.This approach holds substantial engineering reference value for reducing failure rates in electronic manufacturing processes.

关键词

微控制器板卡/失效分析/ESD/EOS防护/生产良率

Key words

microcontroller unit board/failure analysis/ESD/EOS protection/production yield

分类

信息技术与安全科学

引用本文复制引用

曾鹏,李金利..微控制器板卡量产阶段失效分析与整改[J].电子与封装,2026,26(4):44-48,5.

电子与封装

1681-1070

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