电子与封装2026，Vol.26Issue(5)：31-38,8.DOI:10.16257/j.cnki.1681-1070.2026.0059
基于ATE的XC7K系列FPGA测试技术研究
Research on Test Technology of XC7K Series FPGA Based on ATE
朱洪 1李星毅 1易忠 1宋建磊1
作者信息
- 1. 贵州航天计量测试技术研究所,贵阳 550009
- 折叠
摘要
Abstract
FPGAs are widely used in industries such as aerospace and communication electronics due to their programmability,high reliability,and ease of use,thus making FPGA test highly significant.Taking the XC7K series of FPGAs as the subject,the test methods for FPGAs are described based on automated test equipment(ATE).The resources and related tests of the XC7K series FPGAs are introduced,the complete flow,test principles,and methods of FPGA test are discussed,and the verification tests are conducted on the FPGA.Experimental results demonstrate that the FPGA test development process enables rapid and effective development of test programs for the XC7K series FPGAs.The test process can serve as a valuable reference for relevant practitioners.关键词
FPGA/ATE/测试原理/测试技术Key words
FPGA/ATE/test principle/test technology分类
信息技术与安全科学引用本文复制引用
朱洪,李星毅,易忠,宋建磊..基于ATE的XC7K系列FPGA测试技术研究[J].电子与封装,2026,26(5):31-38,8.
