电子与封装2026，Vol.26Issue(6)：43-48,6.DOI:10.16257/j.cnki.1681-1070.2026.0110
一种基于Cortex-M内核的MCU测试方法
Test Method for MCU Based on Cortex-M Cores
张秋丽 1周世晶 2黄沛文 3李荣杰4
作者信息
- 1. 无锡中微晶园电子有限公司,江苏无锡 214035
- 2. 中国电子科技集团公司第五十八研究所,江苏无锡 214035
- 3. 深测芯检测认证有限公司,广东 深圳 518110
- 4. 电子科技大学自动化工程学院,成都 610050
- 折叠
摘要
Abstract
An automated test method for microcontroller unit(MCU)based on the Cortex-M core is introduced.The method utilizes the V93000 automatic test equipment(ATE)to write different programs onto the MCU under test via the serial wire debug(SWD)interface and performs corresponding functional test.This approach effectively addresses the challenge of the repetitive configuration and loading of programs during MCU screening tests,achieving full automation without manual intervention.All program configuration,loading,and test verification processes are entirely handled by the ATE.This method optimizes the test verification process in MCU chip screening and significantly improves overall test efficiency.关键词
MCU/测试/Cortex-M内核Key words
MCU/test/Cortex-M core分类
信息技术与安全科学引用本文复制引用
张秋丽,周世晶,黄沛文,李荣杰..一种基于Cortex-M内核的MCU测试方法[J].电子与封装,2026,26(6):43-48,6.
